The structure of TiOx thin film studied by Raman spectroscopy and XRD

Authors
Xu, WX Zhu, S Fu, XC Chen, Q
Citation
Wx. Xu et al., The structure of TiOx thin film studied by Raman spectroscopy and XRD, APPL SURF S, 148(3-4), 1999, pp. 253-262
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
148
Issue
3-4
Year of publication
1999
Pages
253 - 262
Database
ISI
SICI code
0169-4332(199907)148:3-4<253:TSOTTF>2.0.ZU;2-Q
Abstract
The structure of TiOx thin films have been studied by Raman spectroscopy. T he spectra show that in the film plane, the atoms are connected in a way si milar to that of bulk anatase. Due to the dimensional limitation, the stret ching modes normal to the film plane, A1g + B1g (nu(3) + nu(2)), are suppre ssed. The dependence of this suppression on the calcination temperature and film thickness has also been investigated. (C) 1999 Published by Elsevier Science B.V. All rights reserved.