Preparation and microstructure of nanocrystalline grain Ag-MgF2 cermet film

Nanocrystalline grain Ag-MgF2 cermet films were prepared by using sintered- in-vacuum Ag-MgF2 mixture granules as evaporant. The microstructure and the electronic energy states of the films were examined by x-ray diffraction, transmission electron microscopy, electron diffraction and x-ray photoelect ron spectroscopy. The results showed that obtained Ag-MgF2 cermet films con sist of mainly amorphous MgF2 matrix with embedded fcc-dg nanocrystalline g rains. The principal x-ray diffraction peaks at d = 3.4245, 2.6102, and 2.0 503 Angstrom are probably related to Ag-MgF2 cermet composite structure.