SIMULATION OF ATOMIC-FORCE MICROSCOPY IMAGES OF CLEAVED MICA SURFACES

Authors
TSUJIMICHI K TAMURA H HIROTANI A KUBO M KOMIYAMA M MIYAMOTO A
Citation
K. Tsujimichi et al., SIMULATION OF ATOMIC-FORCE MICROSCOPY IMAGES OF CLEAVED MICA SURFACES, JOURNAL OF PHYSICAL CHEMISTRY B, 101(21), 1997, pp. 4260-4264
Citations number
23
Categorie Soggetti
Chemistry Physical
Journal title
JOURNAL OF PHYSICAL CHEMISTRY B
ISSN journal
15206106 → ACNP
Volume
101
Issue
21
Year of publication
1997
Pages
4260 - 4264
Database
ISI
SICI code
1089-5647(1997)101:21<4260:SOAMIO>2.0.ZU;2-0
Abstract
Taking into account the Coulomb and exchange forces, atomic force micr oscopy (AFM) and lateral force microscopy (LFM) simulations were perfo rmed for a Si(OH)(4) tip and a cleaved mica surface under planer two-d imensional periodic boundary conditions. Imaging of the individual oxy gen atoms in hexagonal oxygen rings and/or K+ ions on a cleaved mica s urface strongly depended on the tip orientation and the applied force. Experimentally obtained AFM images of cleaved mica surfaces were inte rpreted in terms of the present simulation results.