K. Tsujimichi et al., SIMULATION OF ATOMIC-FORCE MICROSCOPY IMAGES OF CLEAVED MICA SURFACES, JOURNAL OF PHYSICAL CHEMISTRY B, 101(21), 1997, pp. 4260-4264
Taking into account the Coulomb and exchange forces, atomic force micr
oscopy (AFM) and lateral force microscopy (LFM) simulations were perfo
rmed for a Si(OH)(4) tip and a cleaved mica surface under planer two-d
imensional periodic boundary conditions. Imaging of the individual oxy
gen atoms in hexagonal oxygen rings and/or K+ ions on a cleaved mica s
urface strongly depended on the tip orientation and the applied force.
Experimentally obtained AFM images of cleaved mica surfaces were inte
rpreted in terms of the present simulation results.