Today's ICs demand advanced testing

Authors
Bursky, D
Citation
D. Bursky, Today's ICs demand advanced testing, ELECTR DES, 47(14), 1999, pp. 22-22
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONIC DESIGN
ISSN journal
00134872 → ACNP
Volume
47
Issue
14
Year of publication
1999
Pages
22 - 22
Database
ISI
SICI code
0013-4872(19990712)47:14<22:TIDAT>2.0.ZU;2-8