Tj. Yang et al., Observation and mobility study of single 180 degrees domain wall using a near-field scanning optical microscope, FERROELECTR, 222(1-4), 1999, pp. 609
We have made a direct and nanometer scale observation of single 180 degrees
domain walls in 500 mu m thick ferroelectric LiTaO3 by using a collection
mode Near-Field Scanning Optical Microscope. We unambiguously identify sing
le domain walls by simultaneously recording nanometer scale topographic and
optical images. The polarization rotation of a linear polarized laser beam
due to the birefringence at the domain wall is optically imaged with 80-10
0nm spatial resolution. Next we have made a direct nanometer scale study of
the mobility of a single 180 degrees domain wall under a uniform applied e
lectric field using the same technique. The mobility of the domain walls is
strongly influenced by sub-surface pinning defects.