Observation and mobility study of single 180 degrees domain wall using a near-field scanning optical microscope

Citation
Tj. Yang et al., Observation and mobility study of single 180 degrees domain wall using a near-field scanning optical microscope, FERROELECTR, 222(1-4), 1999, pp. 609
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
FERROELECTRICS
ISSN journal
00150193 → ACNP
Volume
222
Issue
1-4
Year of publication
1999
Database
ISI
SICI code
0015-0193(1999)222:1-4<609:OAMSOS>2.0.ZU;2-S
Abstract
We have made a direct and nanometer scale observation of single 180 degrees domain walls in 500 mu m thick ferroelectric LiTaO3 by using a collection mode Near-Field Scanning Optical Microscope. We unambiguously identify sing le domain walls by simultaneously recording nanometer scale topographic and optical images. The polarization rotation of a linear polarized laser beam due to the birefringence at the domain wall is optically imaged with 80-10 0nm spatial resolution. Next we have made a direct nanometer scale study of the mobility of a single 180 degrees domain wall under a uniform applied e lectric field using the same technique. The mobility of the domain walls is strongly influenced by sub-surface pinning defects.