Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits

Authors
Fedi, G Manetti, S Piccirilli, MC Starzyk, J
Citation
G. Fedi et al., Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits, IEEE CIRC-I, 46(7), 1999, pp. 779-787
Citations number
12
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS
ISSN journal
10577122 → ACNP
Volume
46
Issue
7
Year of publication
1999
Pages
779 - 787
Database
ISI
SICI code
1057-7122(199907)46:7<779:DOAOSO>2.0.ZU;2-1
Abstract
A procedure for the determination of an optimum set of testable components in the fault diagnosis of analog linear circuits is presented. The proposed method has its theoretical foundation in the testability concept and in th e canonical ambiguity group concept, New considerations relevant to the exi stence of unique solution in the k-fault diagnosis problem of analog linear circuits are presented, and examples of application of the developed proce dure are considered by exploiting a software package based on symbolic anal ysis techniques.