High resolution x-ray imaging using amorphous silicon flat-panel arrays

Citation
Jt. Rahn et al., High resolution x-ray imaging using amorphous silicon flat-panel arrays, IEEE NUCL S, 46(3), 1999, pp. 457-461
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
46
Issue
3
Year of publication
1999
Part
2
Pages
457 - 461
Database
ISI
SICI code
0018-9499(199906)46:3<457:HRXIUA>2.0.ZU;2-6
Abstract
Two dimensional amorphous silicon arrays are the emerging technology for di gital medical x-ray imaging. This paper demonstrates an improved pixel desi gn compared with the current generation of imagers. The geometry of the pix el sensor has been extended from a mesa isolated structure into a continuou s layer above the readout structures of the array. This approach improves s ensitivity to visible light, and to xray illumination when coupled with a c onversion phosphor. Furthermore, this 3-dimensional geometry allows for the fabrication of the finest pitch amorphous silicon array yet manufactured, with a pixel size of 64 mu m square. A test array (512x640 pixels) has been fabricated and tested which demonstrates the success of this approach.