A pixel readout chip for 10-30 MRad in standard 0.25 mu m CMOS

Citation
M. Campbell et al., A pixel readout chip for 10-30 MRad in standard 0.25 mu m CMOS, IEEE NUCL S, 46(3), 1999, pp. 156-160
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
46
Issue
3
Year of publication
1999
Part
1
Pages
156 - 160
Database
ISI
SICI code
0018-9499(199906)46:3<156:APRCF1>2.0.ZU;2-F
Abstract
A radiation tolerant pixel detector readout chip has been developed in a co mmercial 0.25 mu m CMOS process. The chip is a matrix of two columns of 65 identical cells. Each readout cell comprises a preamplifier, a shaper filte r, a discriminator,a delay line and readout logic. The chip occupies 10 mm( 2), and contains about 50 000 transistors. Electronic Boise (similar to 220 e(-) rms) and threshold dispersion (similar to 160 e(-) rms) allow operati on at 1 500 e(-) average threshold. The radiation tolerance of this mixed m ode analog-digital circuit has been enhanced by designing NMOS transistors in enclosed geometry and introducing guardrings wherever necessary. The chi p, which was developed at CERN for the ALICE and LHCb experiments, was stil l operational after receiving 3.6 x 10(13) protons over an area of 2 mm x 2 mm. Other chips were irradiated with X-rays and remained fully functional up to 30 Mrad(SiO2) with only minor changes in analog parameters.,These res ults indicate that careful use of deep submicron CMOS technologies can lead to circuits with high radiation tolerance.