Radiation damage effects by 25MeV protons and thermal annealing effects onthallium bromide nuclear radiation detectors

Citation
K. Hitomi et al., Radiation damage effects by 25MeV protons and thermal annealing effects onthallium bromide nuclear radiation detectors, IEEE NUCL S, 46(3), 1999, pp. 213-217
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
46
Issue
3
Year of publication
1999
Part
1
Pages
213 - 217
Database
ISI
SICI code
0018-9499(199906)46:3<213:RDEB2P>2.0.ZU;2-5
Abstract
In this study, TlBr detectors were irradiated with 25MeV protons accelerate d by an AVF cyclotron. Isothermal annealing was performed to restore the pe rformance of the detectors. In order to characterize the radiation damage a nd thermal annealing effects on the TlBr detectors, we measured current-vol tage (I-V) characteristics, mobility-lifetime (mu tau) products and spectro metric responses. The I-V and mu tau measurements suggest that electron tra ps have been induced by 25MeV protons in the TlBr crystals. X- and gamma-ra y energy spectra were measured for two different electronic conditions: the electric signals induced mainly by electron carriers traversing the crysta l were used for one case and the signal induced by hole carriers were used in the other case. After irradiation of 25MeV protons, the Am-241 X- and ga mma-ray spectra obtained in the former showed significantly degraded energy resolution. No degradation of energy resolution, however, was observed in the latter case. Noticeable improvements of the degraded detector performan ce have been observed after the thermal annealing.