In choosing an accurate insulated gate bipolar transistor (IGBT) model for
power electronic circuit design, physics-based models are frequently prefer
red due to their high accuracy and fast simulation speed in comparison to o
ther types of models. In this paper, an experimental comparison of two such
models is made, using parameters extracted from experimental measurements.
The comparison focuses on two particular IGBT's-the BUP202 and the BUK854
IGBT's-representing the two common types of IGBT's, respectively, the nonpu
nchthrough and the punchthrough IGBT, The models are investigated for the I
GBT's operating in three situations typical of low-power (600 V, 10 A) appl
ications.