Ga. Ummarino et al., Pair symmetry and degree of gap depression at S-I interfaces in HTS Josephson junctions, INT J MOD B, 13(9-10), 1999, pp. 1301-1306
A new possible indirect way of testing pair symmetry in high-Tc superconduc
tors has been set up. The degree of intrinsic gap depression at Superconduc
tor-Insulator [S-I] interfaces required to match I-c(T)R-n(T) data in I-ITS
Josephson junctions depends on the pair symmetry of the material itself, s
o that an higher fraction of d-wave symmetry for the order parameter requir
es less gap depression, while an higher fraction of s-wave corresponds to a
larger degree of gap depression. In order to obtain a general reference va
lue for the intrinsic amount of gap depression at S-I interfaces the de Gen
nes condition has been used, and resulting reduced Ic(T)Rn(T) data have bee
n calculated in the framework of a mixed (s+id)-wave pair symmetry for the
depressed order parameter ranging from pure s to pure d-wave. This model ha
s been tentatively applied to two junctions' made of very different HTSs: Y
BCO and BKBO, yielding a result of almost pure d-wave for YBCO and of pure
s-wave for BKBO.