Properties of TBCCO 2212 thin films for electronic applications

We report on the synthesis and structural and electrical characterization o f high quality Tl2Ba2Ca1Cu2Ox superconducting thin films. The samples have been prepared ex-situ by a combined approach of Metal-Organic Chemical Vapo r Deposition (MOCVD) and thallium vapor diffusion. The films have been grow n on 10x10 mm(2) (100) LaAlO3 substrates. X-ray diffraction (XRD), Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray analyses (EDX) have investigated the morphological and compositional nature of the films. The t ransport properties have been measured using both a four-probes and an indu ctive method. The highest critical temperature and critical current density are 104 K and 1 x 10(6) A/cm(2) respectively. The microwave response of tw o samples has been studied using a microstrip resonator technique. The best surface resistance values are below 200 mu Omega at 1.2 GHz and 4.2 K. Mea surements of the field dependence of the surface resistance have been perfo rmed.