Absolute measurement of thermophysical and optical thin-film properties byphotothermal methods for the investigation of laser damage

Perspectives and limits of the application of the photothermal technique ar e given for the measurement of absorption, thermal, and thermoelastic prope rties in thin films. The peculiarities of this technique in the frequency a nd time domains are discussed in some detail, and selected important result s with respect to laser damage studies in optical coatings are pointed out. Emphasis is placed on the absolute measurement of both optical and thermop hysical properties in dielectric materials in thin-film form and, also, on the influence of both absorption and changed thermal properties in thin fil ms on their thermally induced laser damage resistance.