Ordered binary oxide films of V2O3(0001) on Al2O3

Citation
Q. Guo et al., Ordered binary oxide films of V2O3(0001) on Al2O3, J VAC SCI A, 17(4), 1999, pp. 1887-1892
Citations number
41
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
17
Issue
4
Year of publication
1999
Part
2
Pages
1887 - 1892
Database
ISI
SICI code
0734-2101(199907/08)17:4<1887:OBOFOV>2.0.ZU;2-F
Abstract
Ordered binary oxide films of vanadium oxide have been prepared on an alumi num oxide film supported on Mo(110) under ultrahigh vacuum conditions and c haracterized by various surface analytical techniques. Auger electron spect roscopy, low energy electron diffraction, high-resolution electron loss spe ctroscopy, x-ray photoelectron spectroscopy and ion scattering spectroscopy indicate that the vanadia films grow epitaxially on the Al2O(3)/Mo(110) su rface as V2O3(0001). The results of electronic structural measurements show an increase in the energy of the a(1g) level in the 3d band at low tempera tures, which is a possible explanation for the metal-to-insulator transitio n in V2O3 (C) 1999 American Vacuum Society. [S0734-2101(99)02104-1].