Ordered binary oxide films of vanadium oxide have been prepared on an alumi
num oxide film supported on Mo(110) under ultrahigh vacuum conditions and c
haracterized by various surface analytical techniques. Auger electron spect
roscopy, low energy electron diffraction, high-resolution electron loss spe
ctroscopy, x-ray photoelectron spectroscopy and ion scattering spectroscopy
indicate that the vanadia films grow epitaxially on the Al2O(3)/Mo(110) su
rface as V2O3(0001). The results of electronic structural measurements show
an increase in the energy of the a(1g) level in the 3d band at low tempera
tures, which is a possible explanation for the metal-to-insulator transitio
n in V2O3 (C) 1999 American Vacuum Society. [S0734-2101(99)02104-1].