Epitaxial films of Na2CaGe6O14 with langasite structure were deposited by l
iquid phase epitaxy (LPE) technique on isomorphic Nd3Ga5SiO14 substrates at
a growth temperature of about 1000 degrees C using K2O-V2O5 based flux. Th
e films were about 100 mu m in thickness and had rough surface morphology.
The film composition measurements were made by scanning electron-probe micr
oanalysis (EPMA). EPMA data indicated low content of flux forming: K+ and V
5+ cations in the films grown. Ca2+ enrichment and Na+ decrease were detect
ed in the vicinity of film/substrate interfaces. (C) 1999 Elsevier Science
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