T. Usuki, Trade-off between operational speed and error occurrence for single electron circuits on the quantum scale, MICROEL ENG, 47(1-4), 1999, pp. 269-271
We have investigated single-electron operation using the Landau-Zener (LZ)
tunneling process with/without dissipation. LZ tunneling provides the trade
-off between speed and the error of single electron operation in the two qu
antum dots. We have applied the results of the LZ tunneling to the case of
a single electron shift-register. For this device, the environment coupling
suppresses the error rate at quite low temperatures.