Trade-off between operational speed and error occurrence for single electron circuits on the quantum scale

Authors
Citation
T. Usuki, Trade-off between operational speed and error occurrence for single electron circuits on the quantum scale, MICROEL ENG, 47(1-4), 1999, pp. 269-271
Citations number
9
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
47
Issue
1-4
Year of publication
1999
Pages
269 - 271
Database
ISI
SICI code
0167-9317(199906)47:1-4<269:TBOSAE>2.0.ZU;2-B
Abstract
We have investigated single-electron operation using the Landau-Zener (LZ) tunneling process with/without dissipation. LZ tunneling provides the trade -off between speed and the error of single electron operation in the two qu antum dots. We have applied the results of the LZ tunneling to the case of a single electron shift-register. For this device, the environment coupling suppresses the error rate at quite low temperatures.