AN APPARATUS FOR HIGH-RESOLUTION POSITRON-ANNIHILATION INDUCED AUGER-ELECTRON SPECTROSCOPY USING A TIME-OF-FLIGHT TECHNIQUE

Citation
T. Ohdaira et al., AN APPARATUS FOR HIGH-RESOLUTION POSITRON-ANNIHILATION INDUCED AUGER-ELECTRON SPECTROSCOPY USING A TIME-OF-FLIGHT TECHNIQUE, Applied surface science, 116, 1997, pp. 177-180
Citations number
8
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
116
Year of publication
1997
Pages
177 - 180
Database
ISI
SICI code
0169-4332(1997)116:<177:AAFHPI>2.0.ZU;2-3
Abstract
An apparatus for high-resolution positron-annihilation induced Auger e lectron spectroscopy (PAES) has been constructed at the intense slow p ositron beam line of the Electrotechnical Laboratory. The system uses a short pulsed positron beam (similar to ns width) and the time-of-fli ght (TOF) method for the energy analysis of the Anger electrons. Ln or der to improve the energy resolution, an electrically isolated flight- tube is installed between a sample and a detector, and the electrons a re retarded by biasing the flight tube. This method makes it possible to measure high-resolution PAES spectra with high efficiency.