T. Ohdaira et al., AN APPARATUS FOR HIGH-RESOLUTION POSITRON-ANNIHILATION INDUCED AUGER-ELECTRON SPECTROSCOPY USING A TIME-OF-FLIGHT TECHNIQUE, Applied surface science, 116, 1997, pp. 177-180
Citations number
8
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
An apparatus for high-resolution positron-annihilation induced Auger e
lectron spectroscopy (PAES) has been constructed at the intense slow p
ositron beam line of the Electrotechnical Laboratory. The system uses
a short pulsed positron beam (similar to ns width) and the time-of-fli
ght (TOF) method for the energy analysis of the Anger electrons. Ln or
der to improve the energy resolution, an electrically isolated flight-
tube is installed between a sample and a detector, and the electrons a
re retarded by biasing the flight tube. This method makes it possible
to measure high-resolution PAES spectra with high efficiency.