Resolution of discrepancies of atomic form factors and attenuation coefficients in the near-edge soft X-ray regime

X-rays interactions with atoms should be well understood quantitatively. Re liable knowledge of the complex X-ray form factor (Re(f) and f ") and the p hotoelectric attenuation coefficient sigma(PE) is required for crystallogra phy, medical diagnosis, radiation safety and XAFS studies. Discrepancies be tween currently used theoretical approaches of 200% exist for numerous elem ents from 1 to 3 keV X-ray energies. This paper addresses key discrepancies and derives new theoretical results in near-edge soft X-ray regions of rec ent interest. (C) 1999 Elsevier Science Ltd. All rights reserved.