Correlation between luminescence properties and microstructure of hydrogenated amorphous carbon films investigated by X-ray diffraction and infrared ellipsometry
C. Godet et al., Correlation between luminescence properties and microstructure of hydrogenated amorphous carbon films investigated by X-ray diffraction and infrared ellipsometry, SOL ST COMM, 111(6), 1999, pp. 293-298
Plasma deposited polymer-like amorphous carbon (PLC) films show a strong ph
otoluminescence (PL) in the visible range at room temperature. However, the
origin of the luminescence in terms of microstructure is poorly understood
. In this study, by varying the plasma conditions, hydrogenated carbon (a-C
:H) films, ranging from soft and transparent to denser and more absorbent m
aterials, have been grown. Steady-state PL measurements reveal a steep quen
ching of the luminescence intensity when film density is higher than 1.3 g
cm(-3). Using in situ infrared ellipsometry, C-H bonding analysis shows tha
t this quenching corresponds to a strong decrease of the sp(3) CHn=2,3 grou
p concentrations, consistent with a network crosslinking and to an enrichme
nt of the methyl group environment in pi bonds. In correlation, the evoluti
on of the carbon skeleton has been studied using X-ray diffraction measurem
ents. Structure factors and pair correlation functions evidence clear diffe
rences in the network structure, in particular a shortening of the carbon-c
arbon bond when density increases. (C) 1999 Elsevier Science Ltd. All right
s reserved.