Synchrotron radiation scanning photoemission microscopy: Instrumentation and application in surface science

X-ray photoelectron spectroscopy has become a true microscopic technique at third generation soft X-ray synchrotron sources, finding applications in m any domains of academic and applied research. This paper describes the pres ent status of scanning photoemission microscopy, where by using photon opti cs the photon beam can be focused to micron or submicron dimensions and ima ging or spectroscopy can be performed. It discusses different photon focusi ng optical elements and describes the major components of the constructed s canning microscopes. The applications of imaging and spectroscopy with high lateral resolution in surface science are illustrated, and some recent res ults obtained in different laboratories are briefly reviewed.