Scanning force microscope cantilever for voltage sampling with ultrafast time resolution

Authors
Steffens, WM Oesterschulze, E
Citation
Wm. Steffens et E. Oesterschulze, Scanning force microscope cantilever for voltage sampling with ultrafast time resolution, ELECTR LETT, 35(13), 1999, pp. 1106-1108
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS LETTERS
ISSN journal
00135194 → ACNP
Volume
35
Issue
13
Year of publication
1999
Pages
1106 - 1108
Database
ISI
SICI code
0013-5194(19990624)35:13<1106:SFMCFV>2.0.ZU;2-7
Abstract
A scanning force microscopy (SFM) cantilever for the investigation of ultra fast signals is presented. High temporal resolution is achieved by integrat ing a photoconductive switch within a coplanar waveguide structure onto a l ow temperature GaAs/GaAs cantilever. Experimental results and numerical cal culations of the detection of picosecond guided electrical signals based on the optoelectronic technique of photoconductive sampling are presented.