Login
|
New Account
ITA
ENG
Package analysis: SAM and X-ray
Authors
Moore, TM
Hartfield, CD
Citation
Tm. Moore et Cd. Hartfield, Package analysis: SAM and X-ray, FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 1999, pp. 43-57
Categorie Soggetti
Current Book Contents
Journal title
FAILURE ANALYSIS OF INTEGRATED CIRCUITS
→
ACNP
Year of publication
1999
Pages
43 - 57
Database
ISI
SICI code