Failure site isolation: Photon emission microscopy optical/electron beam techniques

Authors
Cole, EI Barton, DL
Citation
Ei. Cole et Dl. Barton, Failure site isolation: Photon emission microscopy optical/electron beam techniques, FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 1999, pp. 87-112
Categorie Soggetti
Current Book Contents
Journal title
FAILURE ANALYSIS OF INTEGRATED CIRCUITS → ACNP
Year of publication
1999
Pages
87 - 112
Database
ISI
SICI code