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ITA
ENG
Probing technology for IC diagnosis
Authors
Talbot, CG
Citation
Cg. Talbot, Probing technology for IC diagnosis, FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 1999, pp. 113-143
Categorie Soggetti
Current Book Contents
Journal title
FAILURE ANALYSIS OF INTEGRATED CIRCUITS
→
ACNP
Year of publication
1999
Pages
113 - 143
Database
ISI
SICI code