Probing technology for IC diagnosis

Authors
Talbot, CG
Citation
Cg. Talbot, Probing technology for IC diagnosis, FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 1999, pp. 113-143
Categorie Soggetti
Current Book Contents
Journal title
FAILURE ANALYSIS OF INTEGRATED CIRCUITS → ACNP
Year of publication
1999
Pages
113 - 143
Database
ISI
SICI code