Intracavity contacts for low-threshold oxide-confined vertical-cavity surface-emitting lasers

Citation
Dl. Huffaker et Dg. Deppe, Intracavity contacts for low-threshold oxide-confined vertical-cavity surface-emitting lasers, IEEE PHOTON, 11(8), 1999, pp. 934-936
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE PHOTONICS TECHNOLOGY LETTERS
ISSN journal
10411135 → ACNP
Volume
11
Issue
8
Year of publication
1999
Pages
934 - 936
Database
ISI
SICI code
1041-1135(199908)11:8<934:ICFLOV>2.0.ZU;2-1
Abstract
Very low threshold vertical-cavity surface-emitting lasers are demonstrated using intracavity contacts, an upper dielectric Bragg reflector, and an un doped lower AlAs-GaAs Bragg reflector. The undoped lower mirror allows the demonstration of the highest differential efficiency yet achieved for sub-1 00-mu A threshold, which is 60% for a 67-mu A threshold. Devices with small er output coupling show threshold current densities as low 98 A/cm(2), and a minimum threshold current of 23 mu A for a small aperture.