Electrooptical sampling using 1.55-mu m self-seeded semiconductor laser with soliton pulse compression

We report on a compact, reliable and easy to use electrooptic sampling syst em based on a self-seeded semiconductor. laser having a temporal resolution of < 1 ps and a shot noise limited sensitivity of 1 mV, With an operating wavelength of 1.55 mu m and 0.5-ps time jitter of the optical source, it is particularly suited for ultrahigh-speed devices and integrated circuits. F or demonstration, results for an ultrafast metal-semiconductor-metal photod etector are presented.