Probabilistic design of integrated circuits with correlated input parameters

This paper presents an application of Advanced first-order second-moment (A FOSM) reliability method to probabilistic design of integrated circuits wit h correlated parameters. The method avoids the transformation to the space of uncorrelated parameters and provides a conservative estimate of the yiel d. Optimal nominal values are found such that the cost of tolerances is. mi nimized while the desired yield is achieved. Numerical results are presente d for a switched capacitor filter and verified by Monte Carlo simulation.