A. Rogalski, Assessment of HgCdTe photodiodes and quantum well infrared photoconductorsfor long wavelength focal plane arrays, INFR PHYS T, 40(4), 1999, pp. 279-294
Recent trends in infrared detectors are towards large, electronically addre
ssed two-dimensional arrays. In the long wavelength infrared (LWIR) spectra
l range HgCdTe focal plane arrays (FPAs) occupy a dominant position. Howeve
r, the slow progress in the development of large LWIR photovoltaic HgCdTe i
nfrared imaging arrays and the rapid achievements of novel semiconductor he
terostructure systems have made it necessary to foresee the future developm
ent of different material technologies in fabrication large FPAs. Among the
competing technologies in LWIR are the quantum well infrared photoconducto
rs (QWIPs) based on lattice matched GaAs/AlGaAs and strained layer InGaAs/A
lGaAs material systems. This paper compares the technical merits of two IR
detector arrays technologies; photovoltaic HgCdTe and QWIPs. It is clearly
shown that LWIR QWIP cannot compete with HgCdTe photodiode as the single de
vice especially at higher temperature operation (> 70 K) due to fundamental
limitations associated with intersubband transitions. However, the advanta
ge of HgCdTe is less distinct in temperature range below 50 K due to proble
ms involved in HgCdTe material (p-type doping, Shockley-Read recombination,
trap-assisted tunnelling, surface and interface instabilities). Even thoug
h the QWIP is a photoconductor, several of its properties such as high impe
dance, fast response time, long integration time, and low power consumption
, well satisfy the requirements of fabrication of large FPAs. Due to the hi
gh material quality at low temperature, QWIP has potential advantages over
HgCdTe for very LWIR (VLWIR) FPA applications in terms of the array size, u
niformity, yield and cost of the systems. (C) 1999 Elsevier Science B.V. Al
l rights reserved.