Fractal properties of equipotentials close to a rough conducting surface

Citation
Do. Cajueiro et al., Fractal properties of equipotentials close to a rough conducting surface, J PHYS-COND, 11(26), 1999, pp. 4985-4992
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS-CONDENSED MATTER
ISSN journal
09538984 → ACNP
Volume
11
Issue
26
Year of publication
1999
Pages
4985 - 4992
Database
ISI
SICI code
0953-8984(19990705)11:26<4985:FPOECT>2.0.ZU;2-D
Abstract
The Koch curve is used in the problem of evaluating and characterizing the electric equipotential lines in the infinite semi-space limited by a rough conducting one-dimensional surface. The solution of Laplace's equation subj ect to a constant potential difference between the curve and a straight lin e placed at infinity is performed with the help of Liebmann's method, The f ractal dimension, D-f, of the equipotentials is numerically evaluated with a box-counting method. It is found that D-f decays exponentially with dista nce, from the value D-f = 1.273 at the Koch curve to the D-f = 1.0 when the equipotentials become flat smooth lines. The method does not depend on the specific choice of the Koch curve to model the rough substrate.