PIXE analysis with the XR-100CR Si-PIN detector

Authors
Al-Turany, M Meyer, JD Bethge, K
Citation
M. Al-turany et al., PIXE analysis with the XR-100CR Si-PIN detector, NUCL INST B, 155(1-2), 1999, pp. 137-142
Citations number
22
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
155
Issue
1-2
Year of publication
1999
Pages
137 - 142
Database
ISI
SICI code
0168-583X(199907)155:1-2<137:PAWTXS>2.0.ZU;2-6
Abstract
The use of XR-100CR Si-PIN detector for PIXE measurements is examined. The relative efficiency was calculated using the Cu- and GaAs-PIXE spectra prod uced by target bombardment with 1.8 MeV He+ followed by a nonlinear fit pro cedure of the experimental spectra to a detector model. The main feature of this detector model is the presence of a relatively thick Si dead layer in front of the detector. (C) 1999 Elsevier Science B.V. All rights reserved.