Surface roughness evaluation by using wavelets analysis

Authors
Chen, QH Yang, SN Li, Z
Citation
Qh. Chen et al., Surface roughness evaluation by using wavelets analysis, PRECIS ENG, 23(3), 1999, pp. 209-212
Citations number
5
Categorie Soggetti
Instrumentation & Measurement
Journal title
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING
ISSN journal
01416359 → ACNP
Volume
23
Issue
3
Year of publication
1999
Pages
209 - 212
Database
ISI
SICI code
0141-6359(199907)23:3<209:SREBUW>2.0.ZU;2-R
Abstract
Based upon wavelets theory, a novel reference for evaluating surface roughn ess is proposed here, wherein the surface roughness can be separated from t he actual surface profile f(t). Some examples have shown that more precise evaluation results could have been achieved than those found using classica l reference lines. (C) 1999 Elsevier Science Inc. All rights reserved.