Prolog to - An overview of manufacturing yield and reliability modeling for semiconductor products - An introduction to the paper by Kuo and Kim

Authors
Esch, J
Citation
J. Esch, Prolog to - An overview of manufacturing yield and reliability modeling for semiconductor products - An introduction to the paper by Kuo and Kim, P IEEE, 87(8), 1999, pp. 1327-1328
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
PROCEEDINGS OF THE IEEE
ISSN journal
00189219 → ACNP
Volume
87
Issue
8
Year of publication
1999
Pages
1327 - 1328
Database
ISI
SICI code
0018-9219(199908)87:8<1327:PT-AOO>2.0.ZU;2-E