Brightness degradation in electroluminescent ZnS : Cu

Citation
Ne. Brese et al., Brightness degradation in electroluminescent ZnS : Cu, SOL ST ION, 123(1-4), 1999, pp. 19-24
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SOLID STATE IONICS
ISSN journal
01672738 → ACNP
Volume
123
Issue
1-4
Year of publication
1999
Pages
19 - 24
Database
ISI
SICI code
0167-2738(199908)123:1-4<19:BDIEZ:>2.0.ZU;2-R
Abstract
Monte Carlo simulations using crystal chemical constraints have been used t o elucidate the copper diffusion mechanisms in copper-doped zinc sulfide. R elaxation around the ZnS\Cu2-xS interface allows facile copper diffusion, p articularly in the presence of substitutional oxygen or sulfur vacancies. C opper diffusion is responsible for the brightness degradation in this elect roluminescent material. Reducing sulfur vacancies and substitutional oxygen species are outlined as ways to reduce the luminescence decay. (C) 1999 El sevier Science B.V. All rights reserved.