Effect of polyvinylcarbazole (PVK) barrier layer on charge storage in amorp
hous selenium (a-Se) films (similar to 100 mu m) in the temperature range o
f 295-385 K has been studied as a function of barrier layer thickness (simi
lar to 2400-7500 Angstrom) using thermally stimulated discharge current (TS
D) technique. TSD spectra of a-Se films show a significant reduction in the
charge stored under relaxation peaks upon incorporation of PVK interface l
ayer. These results have been attributed to blocking and field enhanced mob
ility role of PVK barrier layer film. (C) 1999 American Institute of Physic
s. [S0003-6951(99)00631-2].