In this letter, we report on the influence of lead content on thin-film fer
roelectric properties of lead niobium zirconate titanate. These films were
prepared by the sol-gel technique and deposited on (La,Sr)CoO3 electrodes.
It was determined that 7% excess lead in the sol was required to obtain nom
inally stoichiometric films. Lead deficiency in the film results in lead va
cancies and excess lead is accommodated by forming octahedral site vacancie
s. Further amounts of lead in the sol leads to second phase PbO, which then
coexists with the perovskite phase. The charged vacancies are compensated
by mobile holes, which can interact with domains during switching. Under ap
plied field and short pulse widths, the films with larger number of holes e
xhibited poor switching. Significant polarization relaxation was measured f
or films with excess lead, which is attributed to interaction of ionic defe
cts with domains. Our results indicate that lead excess leads to poor relia
bility properties,whereas lead deficiency suppresses the polarization of th
e capacitors. (C) 1999 American Institute of Physics. [S0003-6951(99)00931-
6].