Diagnosis of scan cells in BIST environment

The paper presents a new fault diagnosis technique for scan-based designs w ith BIST. It can be used for nonadaptive identification of the scan cells t hat are driven by erroneous signals. The proposed scheme employs a pseudora ndom scan cell selection routine which, in conjunction with a conventional signature analysis and simple reasoning procedure, allows flexible trade-of fs between the test application time and the diagnostic resolution.