Anomaly of X-ray diffraction profile in single-walled carbon nanotubes

Authors
Maniwa, Y Kumazawa, Y Saito, Y Tou, H Kataura, H Ishii, H Suzuki, S Achiba, Y Fujiwara, A Suematsu, H
Citation
Y. Maniwa et al., Anomaly of X-ray diffraction profile in single-walled carbon nanotubes, JPN J A P 2, 38(6AB), 1999, pp. L668-L670
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS → ACNP
Volume
38
Issue
6AB
Year of publication
1999
Pages
L668 - L670
Database
ISI
SICI code
Abstract
X-ray diffraction (XRD) studies on single-walled carbon nanotube (SWNT) sam ples prepared by the arc-dischage method were reported. The XRD profile was basically explained to be a result of triangular packing of SWNTS with a l attice constant of 17.1 Angstrom and an average nanotube radius of 7.1 Angs trom. We found an anomalous change in XRD profiles before and after heat-tr eatment of the SWNT samples in air at similar to 350 degrees C. Combined wi th gravimetric measurements and resistivity; measurements, a detailed simul ation of the XRD profiles showed that air (oxygen, and/or nitrogen and/or w ater) can be condensed inside:the SWNTs.