Misfit dislocations and stresses in CdxHg1-xTe/CdTe heterojunctions

Citation
Iv. Kurilo et al., Misfit dislocations and stresses in CdxHg1-xTe/CdTe heterojunctions, J CRYST GR, 204(4), 1999, pp. 447-452
Citations number
16
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
204
Issue
4
Year of publication
1999
Pages
447 - 452
Database
ISI
SICI code
0022-0248(19990801)204:4<447:MDASIC>2.0.ZU;2-M
Abstract
Elastic properties and characteristics of misfit dislocations of CdxHg1-xTe /CdTe heterostructures were estimated: the energy density of the film-subst rate interface, the critical thickness for loss of coherency in a heterojun ction, the elastic strain in the epitaxial system, the length of the cracks in the epilayer, the free edge displacement of a layer, the misfit disloca tions spacing, the magnitude of Burgers vector lying in different misfit pl anes, and the interface dangling bond density. (C) 1999 Elsevier Science B. V. All rights reserved.