In situ X-ray absorption spectroscopy characterization of V2O5 xerogel cathodes upon lithium intercalation

Citation
M. Giorgetti et al., In situ X-ray absorption spectroscopy characterization of V2O5 xerogel cathodes upon lithium intercalation, J ELCHEM SO, 146(7), 1999, pp. 2387-2392
Citations number
36
Categorie Soggetti
Physical Chemistry/Chemical Physics","Material Science & Engineering
Journal title
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
ISSN journal
00134651 → ACNP
Volume
146
Issue
7
Year of publication
1999
Pages
2387 - 2392
Database
ISI
SICI code
0013-4651(199907)146:7<2387:ISXASC>2.0.ZU;2-O
Abstract
Vanadium pentoxide materials prepared through sol-gel processes act as exce llent intercalation hosts for lithium as well as for polyvalent cations. Pr evious ex situ X-ray absorption spectroscopy and X-ray diffraction characte rizations have shown that the electrochemical performance of vanadium pento xide xerogels depends inversely on the long-range order of the V2O5-layered structure. Recently, new ways to prevent the self-organization of the dry materials, which takes place upon water removal from the starting hydrogel, have been introduced. In the present paper we report on the in situ X-ray absorption spectroscopy characterization of a spray-coated V2O5 (freeze-dri ed) xerogel cathode upon lithium intercalation. (C) 1999 The Electrochemica l Society. S0013-4651(98)09-048-X. All rights reserved.