Heat transfer in ultrahigh vacuum scanning thermal microscopy

Citation
W. Muller-hirsch et al., Heat transfer in ultrahigh vacuum scanning thermal microscopy, J VAC SCI A, 17(4), 1999, pp. 1205-1210
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
17
Issue
4
Year of publication
1999
Part
1
Pages
1205 - 1210
Database
ISI
SICI code
0734-2101(199907/08)17:4<1205:HTIUVS>2.0.ZU;2-0
Abstract
We report investigations of the heat transfer in scanning tunneling microsc opy and scanning thermal microscopy under ultrahigh vacuum conditions. The distance dependence of the heat transfer is found to increase significantly for tip-sample distances smaller than several 10 nm, indicating the existe nce of a proximity effect in heat transfer between tip and sample. Upon sca nning the thermal probe over the sample, topographic features of the sample can be clearly seen in the thermal image with down to 10 nm size. (C) 1999 American Vacuum Society. [S0734-2101(99)12104-3].