Low temperature photoconductivity detection of phosphorus in diamond

Citation
K. Haenen et al., Low temperature photoconductivity detection of phosphorus in diamond, PHYS ST S-A, 174(1), 1999, pp. 53-58
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
174
Issue
1
Year of publication
1999
Pages
53 - 58
Database
ISI
SICI code
0031-8965(199907)174:1<53:LTPDOP>2.0.ZU;2-7
Abstract
Photocurrent measurements and the Constant Photocurrent Method (CPM) were u sed to carry out a spectroscopic study of epitaxial phosphorus-doped n-type CVD diamond films. Two optically active defect levels, X-P1 and X-P2, With photoionisation energy of 0.56 and 0.81 eV, respectively, found in previou s work [1] are discussed in detail here. Comparison of CPM data with the ac tivation energy of the carriers from Hall effect measurements suggest that the X-P1 defect can be attributed to the P-related donor level. X-P2 remain s unidentified. Measurements carried out on a set of samples show that the X-P2 defect is only present in some samples showing high resistivity. To st udy the electronic structure of the X-P1 level, photocurrent measurements a t low temperatures (liquid N-2 and liquid He) were done, revealing a phonon -induced oscillatory photoconductivity. Two sets of minima are observed whi ch allow an estimation of the position of the first two excited states of p hosphorus. Also a comparison is made with results from FTIR measurements.