Photocurrent measurements and the Constant Photocurrent Method (CPM) were u
sed to carry out a spectroscopic study of epitaxial phosphorus-doped n-type
CVD diamond films. Two optically active defect levels, X-P1 and X-P2, With
photoionisation energy of 0.56 and 0.81 eV, respectively, found in previou
s work [1] are discussed in detail here. Comparison of CPM data with the ac
tivation energy of the carriers from Hall effect measurements suggest that
the X-P1 defect can be attributed to the P-related donor level. X-P2 remain
s unidentified. Measurements carried out on a set of samples show that the
X-P2 defect is only present in some samples showing high resistivity. To st
udy the electronic structure of the X-P1 level, photocurrent measurements a
t low temperatures (liquid N-2 and liquid He) were done, revealing a phonon
-induced oscillatory photoconductivity. Two sets of minima are observed whi
ch allow an estimation of the position of the first two excited states of p
hosphorus. Also a comparison is made with results from FTIR measurements.