X-ray-absorption edge separation using diffraction anomalous fine structure

Citation
B. Ravel et al., X-ray-absorption edge separation using diffraction anomalous fine structure, PHYS REV B, 60(2), 1999, pp. 778-785
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
60
Issue
2
Year of publication
1999
Pages
778 - 785
Database
ISI
SICI code
0163-1829(19990701)60:2<778:XESUDA>2.0.ZU;2-B
Abstract
When two or more absorption edges in a material are sufficiently close in e nergy, extended-x-ray-absorption-fine-structure spectroscopy is of limited utility as the usable data range above the lower-energy edge is truncated b y the higher-energy edge. Energy or wavelength discriminating detection met hods may fail to resolve fluorescence lines which are very close in energy. In this paper we present a solution to this problem using the resolution i n momentum transfer of diffraction anomalous fine structure (DAFS) to separ ate the fine-structure signals from elements with closely spaced fluorescen ce lines. We demonstrate our technique by isolating the titanium edge signa l from DAFS measurements of BaTiO3.