A study of self-aligned doped channel MOSFET structure for low power and low 1/f noise operation

Citation
T. Yoshitomi et al., A study of self-aligned doped channel MOSFET structure for low power and low 1/f noise operation, SOL ST ELEC, 43(7), 1999, pp. 1219-1224
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
SOLID-STATE ELECTRONICS
ISSN journal
00381101 → ACNP
Volume
43
Issue
7
Year of publication
1999
Pages
1219 - 1224
Database
ISI
SICI code
0038-1101(199907)43:7<1219:ASOSDC>2.0.ZU;2-F
Abstract
A self-Aligned Doped Channel (SADC) is proposed and investigated for the fi rst time. In the SADC process, the channel doping process is carried out by using solid phase diffusion from the gate; hence the doping region is full y self-aligned to the gate, and the junction capacitance can be reduced. In addition, the implantation damage in the channel is reduced. We obtained 0 .25 mu m gate length nMOSFETs with low noise and low power consumption by u sing the SADC structure. Hence, this structure is attractive for small geom etry RF CMOS devices. (C) 1999 Elsevier Science Ltd. All rights reserved.