Erbium (Er) doped semiconductors are of interest for light-emitting device
applications operating at around 1.55 mu m and for the potential integratio
n with other semiconductor devices. However, the optical emission of Er3+ i
ons in semiconductors has not been as efficient as in dielectric materials,
particularly at room temperature. This may be because ionic bonds, which a
re characteristic of dielectrics, are better suited for forming the require
d Er3+ energy levels than are covalent bonds, which are present in most III
-V semiconductors. In this paper, we report 1.55 mu m emission from an Er-d
oped GaN LED. We also discuss the effect of the measurement temperature on
the emission spectrum as well as the effect of sample annealing on the emis
sion spectrum. (C) 1999 Elsevier Science Ltd. All rights reserved.