Photoluminescence (PL) spectroscopy has been used to investigate praseodymi
um (Pr) related transitions in Pr-implanted GaN. Wurtzite GaN epilayers wer
e grown by metalorganic chemical vapor deposition on sapphire substrates an
d subsequently ion implanted with Pr to a dose of 5.7x10(13)/cm(2). The imp
lanted samples were annealed in nitrogen to facilitate recovery from implan
tation related damage. Narrow PL emission bands related to 4f intrashell tr
ansitions of the trivalent Pr ion were observed near 650, 950, 1100, and 13
00 nm. The dependence of PL emission on sample temperature, excitation inte
nsity, oxygen incorporation, and annealing temperature was systematically s
tudied. We find that the PL efficiency increases exponentially with anneali
ng temperature up to the maximum temperature of 1050 degrees C applied in t
he current study. Furthermore, the PL emission shows no evidence of signifi
cant thermal quenching over the sample temperature range of 10-300 K. This
thermal stability will have particular advantages for applications in high
temperature optoelectronic devices. (C) 1999 American Institute of Physics.
[S0003-6951(99)01732-5].