A. Hammiche et al., Photothermal FT-IR spectroscopy: A step towards FT-IR microscopy at a resolution better than the diffraction limit, APPL SPECTR, 53(7), 1999, pp. 810-815
We have used a miniaturized Wollaston wire resistive thermometer as a probe
to record infrared absorption spectra of polymeric samples by detecting ph
otothermally induced temperature fluctuations at the sample surface. This m
ethod opens the way to absorption Fourier transform infrared spectroscopy/m
icroscopy with a spatial resolution that is no longer diffraction limited,
but is determined instead by the size of the contact between probe and samp
le. At present, this is on the order of a few hundred nanometers. The therm
al probe, of a type used in scanning thermal microscopy and microthermal an
alysis, allows us to detect the photothermal response of a specimen exposed
to the beam of a Fourier transform infrared spectrometer and heated thereb
y. The signal from this probe measures the resulting temperature fluctuatio
ns, and thus provides an interferogram which replaces the interferogram nor
mally obtained by means of direct detection of the IR transmitted by a samp
le.