UNAMBIGUOUS PHASE DETERMINATION USING A NEW X-RAY INTERFEROMETER ON SEPARATED CRYSTALS

Authors
NIKULIN AY
Citation
Ay. Nikulin, UNAMBIGUOUS PHASE DETERMINATION USING A NEW X-RAY INTERFEROMETER ON SEPARATED CRYSTALS, Physics letters. A, 229(6), 1997, pp. 387-391
Citations number
9
Categorie Soggetti
Physics
Journal title
Physics letters. A → ACNP
ISSN journal
03759601
Volume
229
Issue
6
Year of publication
1997
Pages
387 - 391
Database
ISI
SICI code
0375-9601(1997)229:6<387:UPDUAN>2.0.ZU;2-P
Abstract
A new X-ray interferometer for phase-sensitive diffractometry is consi dered. The method exploits measurements of relative phase changes in a standing wave between two separated crystals. Analysis of the superpo sition of the minimal-phase profile retrieved via a logarithmic Hilber t transform and unknown phase term allows the determination of the com plete phase profile. (C) Elsevier Science B.V.