A SIMS procedure has been developed to quantify H, Li and B in schorl-elbai
te series tourmalines. It relies on the use of calibration curves determine
d from various tourmaline standards, mainly characterized by crystal-struct
ure refinement (SREF) and electron-microprobe analysis (EMPA). The SIMS dat
a have allowed us to investigate matrix effects on H, Li and B ionization (
with Si and Al assumed, in turn, as the matrix-reference element), and to t
est the accuracy of our general calibration curves, previously developed fo
r silicates. In particular, the H/Si as well as H/Al ionization behaviour a
re not indicative of significant residual matrix effects; the agreement bet
ween SIMS and reference data is mostly within the reproducibility of analys
is (2 sigma), and for all samples is within 10%. The IY(Li/Si) and IY(Li/Al
) are affected by matrix effects possibly related to the different (Fe+Mn)
and/or (Si+Al) content of the sample. Since the maximum variation in terms
of chemical composition in these matrices concerns Fe and Mn concentrations
, we used at a first approximation (Fe+Mn) content to investigate the IY(Li
) variation among the various samples. A linear regression: IY(Li/Si) (or s
imilarly, IY(Li/Al)) vs. (Fel-Mn) (cat %) was obtained and used to improve
the accuracy of analysis. All the experimental IY(LI) agree with the expect
ed values within 13% rel. (in one case: 24% rel.), mostly comparable to the
uncertainty of Li estimation in these matrices. We can pessimistically put
the uncertainty of our regression lines for Li at 15-20% rel. The IY(B/Si)
and IY(B/Al) seem to be affected, although to a lower extent than Li, by t
he same kind of matrix effects, the maximum variation of IY(B) being simila
r to 10-12%. Accurate B analyses, better than 3% rel., can be obtained by c
alibrating IY(B) vs. (Fe+Mn) content of each sample. A few examples of this
procedure testify the possibility to use this approach to achieve accurate
data for H, Li and B by SIMS in schorl-elbaitic tourmaline samples.