A new self-aligned offset staggered polysilicon thin-film transistor

Citation
Ji. Han et al., A new self-aligned offset staggered polysilicon thin-film transistor, IEEE ELEC D, 20(8), 1999, pp. 381-383
Citations number
7
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE ELECTRON DEVICE LETTERS
ISSN journal
07413106 → ACNP
Volume
20
Issue
8
Year of publication
1999
Pages
381 - 383
Database
ISI
SICI code
0741-3106(199908)20:8<381:ANSOSP>2.0.ZU;2-G
Abstract
A new self-aligned offset staggered polysilicon thin-film transistor (poly- Si TFT) has been proposed and demonstrated to have a suppressed leakage cur rent. For the self-aligned offset structure, planarization with thick photo resist and etchback of photoresist are successfully utilized, The offset le ngth can be easily controlled by the thickness of the gate material without photolithographic limitation. In the self-aligned offset polysilicon TFT's , the leakage current decreases with an increasing offset length.