A new self-aligned offset staggered polysilicon thin-film transistor (poly-
Si TFT) has been proposed and demonstrated to have a suppressed leakage cur
rent. For the self-aligned offset structure, planarization with thick photo
resist and etchback of photoresist are successfully utilized, The offset le
ngth can be easily controlled by the thickness of the gate material without
photolithographic limitation. In the self-aligned offset polysilicon TFT's
, the leakage current decreases with an increasing offset length.