Optimization of word-line booster circuits for low-voltage flash memories

Citation
T. Tanzawa et S. Atsumi, Optimization of word-line booster circuits for low-voltage flash memories, IEEE J SOLI, 34(8), 1999, pp. 1091-1098
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE JOURNAL OF SOLID-STATE CIRCUITS
ISSN journal
00189200 → ACNP
Volume
34
Issue
8
Year of publication
1999
Pages
1091 - 1098
Database
ISI
SICI code
0018-9200(199908)34:8<1091:OOWBCF>2.0.ZU;2-Q
Abstract
Two word-line booster circuits, which output a word-line voltage for readin g dash memory data, are analyzed and optimized. A capacitor-switched booste r circuit outputs a voltage higher than the supply voltage by switching the connection state of one or more boosting capacitors with the load capacito r from parallel to series. The optimum number of capacitors and Capacitance per boosting capacitor are obtained as a function of the voltage ratio of the required high voltage to the supply voltage. The operation current cons umed by the boosting operation is also analytically derived. In addition, a nother booster circuit-Dickson charge-pump circuit-is optimized under the c ondition to maximize the output current at a high word-line voltage. Charac teristics of the booster circuits are compared, and the selection of booste r circuit for low-voltage flash memory is discussed.